At Environmental Analysis Associates, Inc. (EAA), we offer one of the most advanced Scanning Electron Microscopy (SEM) services available in the environmental testing industry—delivering detailed insights into the composition, size, and origin of airborne and surface contaminants in a matter of minutes.

Our proprietary SEM-based dust analysis method is purpose-built for industrial hygiene, environmental investigations, and forensic contamination assessments. By integrating high-speed silicon drift (SDD) X-ray detectors, industry-trusted automated particle classification software, and custom interpretation algorithms developed in-house, EAA has redefined the speed and scope of environmental particle analysis.

For the first time in the industry, we can simultaneously evaluate particle size, mass, and elemental composition—creating a data-rich profile that helps identify probable emission sources, contamination types, and potential health concerns. What once took a full day (or longer) now takes just 20–30 minutes, making EAA’s SEM service both cost-effective and unmatched in turnaround time.

This level of real-time data resolution is exclusive to EAA and is not available anywhere else in the industry.

What Our SEM Analysis Offers:

• Particle chemistry, mass distribution, and size analysis

• Source profiling for dust, soot, ash, metals, polymers, fibers, and more

• High-resolution imaging and elemental X-ray spectroscopy

• Forensic contamination identification for residential, commercial, industrial, and legal applications

• Support for exposure modeling, HVAC diagnostics, and product failure investigations